RF Lab Equipment

Advanced RF and test equipment infrastructure

Explore the RF lab setup at SiCrest Semiconductors, covering measurement, validation, signal generation, simulation, and characterization equipment used across RF, mixed-signal, and hardware development workflows.

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Measurement Signal Generation Validation Simulation Characterization

What this page includes

Key RF lab equipment, with images and application-focused descriptions for each instrument.

Oscilloscope and DMM platforms
VNA, spectrum analyzer, and signal generator
Logic analysis and programmable supplies
Design simulation and anechoic chamber support

RF Lab Equipment

Keysight Oscilloscope

Oscilloscope with different ranges
Bode plot capability to characterize power supply designs
Function generator support

Vector Network Analyzer

Dual-port VNA in sub-6 GHz range
S11, S12, S21, and S22 measurements
Embedding and de-embedding features
TDR measurements

Keysight DMM

6.5 digits with measurement capability down to pA range
Histogram details for problem analysis
Automation for production testing

Power Supplies

Programmable power supplies in different ranges
Steps, ramps, and linear increments
Emulates distortion with scripts
Automated production testing

Tektronix Logic Analyzer

Deep memory and high-speed timing analysis of digital logic signals
500 ps timing resolution
Captures elusive hardware problems
Programmable scripts to automate analysis

Signal Generator

WiFi, Bluetooth, Zigbee, and similar signal generation for receiver sensitivity analysis
Different patterns and sweep emulations

Spectrum Analyzer

EMC compliance tests
WiFi, Bluetooth, Zigbee, and related wireless signal characterization
WiFi and Bluetooth signal interference and emission measurements

Design and Simulation

Simulation study and analysis of RF passive circuits and antennas with open-source tools

Anechoic Chamber

Attenuation: 100 dB @ 20 MHz to 6 GHz

Need access to RF lab capabilities?

Reach out to SiCrest Semiconductors for collaborations, validation support, RF characterization discussions, or hardware-focused development engagement.

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